The top-event's failure frequency for non-coherent multi-state fault treesBOSSCHE, A.Microelectronics and reliability. 1984, Vol 24, Num 4, pp 707-715, issn 0026-2714Article

Forecasting the reliability of telecommunications systemsMONK, C. L; FALCONER, R. M; BEAUMONT, J. M et al.British Telecom technology journal. 1984, Vol 2, Num 1, pp 5-13, issn 0265-0193Article

Methods of fault tree analysis and their limitsWEBER, G. G.Kernforschungszentrum Karlsruhe. 1984, Num 3824, issn 0303-4003, 65 p.Serial Issue

From fault-tree to fault-identificationKISS, L.IEEE transactions on reliability. 1983, Vol 32, Num 5, pp 423-425, issn 0018-9529Article

Evaluation of large fault-trees with repeated events using an efficient bottom-up algorithmSTECHER, K.IEEE transactions on reliability. 1986, Vol 35, Num 1, pp 51-58, issn 0018-9529Article

A method of transformation of the disjoint sum in fault tree analysisRUAN KEQIANG.Reliability engineering. 1986, Vol 16, Num 3, pp 207-217, issn 0143-8174Article

Boolean difference techniques for time-sequence and common-cause analysis of fault-treesMORET, B. M. E; THOMASON, M. G.IEEE transactions on reliability. 1984, Vol 33, Num 5, pp 399-405, issn 0018-9529Article

Arbres de défaillance : Outil de communication au service de la maintenance = Fault tree : communication tool for maintenanceSCHAUB, J.-L; DI PIAZZA, S.Fiabilité & maintenabilité. Colloque national. 1996, pp 592-598, 2VolConference Paper

Etude de fiabilité d'un poste 400 kV = Reliability analysis of a 400 kV substationBULOT, M.Revue générale de l'électricité (Paris). 1992, Num 8, pp 19-24, issn 0035-3116Article

The propagation of uncertainties in failure eventKEEY, R. B; SMITH, C. H.Reliability engineering. 1985, Vol 10, Num 2, pp 105-127, issn 0143-8174Article

PRIME IMPLICANTS OF NONCOHERENT FAULT TREESWORRELL RB; STACK DW; HULME BL et al.1981; IEEE TRANS. RELIAB.; ISSN 0018-9529; USA; DA. 1981; VOL. 30; NO 2; PP. 98-100; BIBL. 8 REF.Article

Comment on : an algorithm for exact fault-tree probabilities without cut setsPATTERSON-HINE, F. A; KOEN, B. V.IEEE transactions on reliability. 1987, Vol 36, Num 5, pp 640-641, issn 0018-9529Article

Generalized binary binomial group testingNADER MEHRAVARI.SIAM journal on algebraic and discrete methods. 1986, Vol 7, Num 1, pp 159-166, issn 0196-5212Article

Digraph matrix analysisSACKS, I. J.IEEE transactions on reliability. 1985, Vol 34, Num 5, pp 437-446, issn 0018-9529Article

Digraphs and Fault treesALLEN, D. J.Industrial & engineering chemistry fundamentals. 1984, Vol 23, Num 2, pp 175-180, issn 0196-4313Article

An illustrative example of fault tree synthesis based on control loop structureSHAFAGHI, A; LEES, F. P; ANDOW, P. K et al.Reliability engineering. 1984, Vol 8, Num 4, pp 193-233, issn 0143-8174Article

Help identify causes of process industry accidents : Consider using this fault tree analysis toolSHARIFF, A. M; HUSSAN, N. A; DUTTA, B. K et al.Hydrocarbon processing (International ed.). 2009, Vol 88, Num 1, pp 84-88, issn 0018-8190, 5 p.Article

A new way of quantifying risks. IIWADE GOODNER, H.Chemical engineering (New York, NY). 1993, Vol 100, Num 11, pp 140-146, issn 0009-2460, 5 p.Article

Uncertainty propagation in Fault tree analyses using lognormal distributionsMASERA, M.IEEE transactions on reliability. 1987, Vol 36, Num 1, pp 145-149, issn 0018-9529Article

Fault-tree analysis by fuzzy probabilityTANAKA, H; FAN, L. T; LAI, F. S et al.IEEE transactions on reliability. 1983, Vol 32, Num 5, pp 453-457, issn 0018-9529Article

Treatment of complementary events in constructing the linked Level 1 and Level 2 fault treesJO, Young G; AHN, Kwang-Il.Nuclear engineering and design. 2009, Vol 239, Num 4, pp 769-780, issn 0029-5493, 12 p.Article

Implementation of a fault tree methodKÄRKI, S; HYVÄRINEN, J.International conference on applications of artificial intelligence in engineering. 1996, isbn 1-85312-410-9, p. 131Conference Paper

On competitive group testingDING-ZHU DU; HAESUN PARK.SIAM journal on computing (Print). 1994, Vol 23, Num 5, pp 1019-1025, issn 0097-5397Article

A new way of quantifying risksGOODNER, W.Chemical engineering (New York, NY). 1993, Vol 100, Num 10, pp 114-120, issn 0009-2460Article

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